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E. Haimi

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2008
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Serguei Novikov, J. Sinkkonen, Timur Nikitin, L. Khriachtchev, M. Räsänen, E. Haimi:
Free-standing SiO₂ films containing Si nanocrystals directly suitable for transmission electron microscopy. Microelectron. J. 39(3-4): 518-522 (2008)

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