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T. S. Scott

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1996
[j1]
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  - journals/ibmrd/ZieglerCMMCNRWFHLWOUROMSSYETSTSKW96
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  - https://dblp.org/rec/journals/ibmrd/ZieglerCMMCNRWFHLWOUROMSSYETSTSKW96
James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus:
IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40(1): 3-18 (1996)

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