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Gang Chen 0011
Person information
- affiliation: Huawei, Santa Clara, CA, USA
- affiliation: Mentor Graphics, Wilsonville, OR, USA
- affiliation: University of Iowa, Iowa City, IA, USA
Other persons with the same name
- Gang Chen — disambiguation page
- Gang Chen 0001 — Zhejiang University, Database Laboratory, China
- Gang Chen 0002 (aka: Aaron Chen 0001) — Victoria University of Wellington, Unitec Institute of Technology, Auckland, New Zealand (and 1 more)
- Gang Chen 0003 — Tsinghua University, Department of Automation, Beijing, China
- Gang Chen 0004 — Lingcore Lab (and 1 more)
- Gang Chen 0005 — Nanjing University, Department of Geographic Information Science, China
- Gang Chen 0006 — Ningbo University, Institute of DSP and Software Techniques, China
- Gang Chen 0007 — University of California Riverside, Department of Electrical Engineering, CA, USA (and 1 more)
- Gang Chen 0008 — National Institute of Mental Health, Bethesda, MD, USA
- Gang Chen 0009 — University of California Los Angeles, Speech Processing and Auditory Perception Laboratory, CA, USA
- Gang Chen 0010 — Central South University, Changsha, China
- Gang Chen 0012 — Fudan University, China
- Gang Chen 0013 — Unilever R&D, Port Sunlight, UK
- Gang Chen 0014 — Chongqing University, College of Automation, MOE Key Laboratory of Dependable Service Computing in Cyber Physical Society, China (and 1 more)
- Gang Chen 0015 — The University of North Carolina at Charlotte, Department of Geography and Earth Sciences, NC, USA (and 2 more)
- Gang Chen 0016 — Chinese Academie of Sciences, National Space Science Center, China
- Gang Chen 0017 — Zhejiang University, State Key Laboratory of Industrial Control Technology, China
- Gang Chen 0018 — Huazhong University of Science and Technology, School of Computer Science and Technology, China
- Gang Chen 0019 — MIT, Mechanical Engineering Department, Cambridge, MA, USA
- Gang Chen 0020 (aka: Michael Gang Chen) — University of California Los Angeles, Magma Design Automation, CA, USA
- Gang Chen 0021 (aka: Gang (Jeff) Chen) — Medical College of Wisconsin, Department of Biophysics, Milwaukee, WI, USA
- Gang Chen 0022 — National University of Singapore, Department of Electrical and Computer Engineering, Singapore
- Gang Chen 0023 — Sun Yat-sen University, School of Data and Computer Science, Guangzhou, China (and 2 more)
- Gang Chen 0024 — Nanyang Technological University, School of Electrical and Electronic Engineering, Singapore (and 2 more)
- Gang Chen 0025 — Sichuan University, School of Mathematics, Chengdu, China
- Gang Chen 0026 — Wuhan University, School of Electronics and Information, China (and 1 more)
- Gang Chen 0027 — University of California Riverside, Department of Electrical Engineering, CA, USA
- Gang Chen 0028 — Tianjin University, School of Chemical Engineering and Technology, China
- Gang Chen 0029 — Beijing University of Posts and Telecommunications, School of Automation, China
- Gang Chen 0030 — Heriot-Watt University, Edinburgh, UK
- Gang Chen 0031 — Fuzhou University, School of Mechanical Engineering and Automation, China
- Gang Chen 0032 — SUNY at Buffalo, Department of Computer Science, NY, USA
- Gang Chen 0033 — Nanjing University of Science and Technology, School of Mechanical Engineering, China (and 1 more)
- Gang Chen 0034 — Shanghai Jiao Tong University, Department of Electronic Engineering, China
- Gang Chen 0035 — State Grid Sichuan Electric Power Research Institute, Chengdu, China (and 1 more)
- Gang Chen 0036 — Shanghai Jiaotong University, School of Mechanical Engineering, State Key Laboratory of Mechanical System and Vibration, China
- Gang Chen 0037 — Zhengzhou University, Computer and artificial intelligence school, China
- Gang Chen 0038 — Sun Yat-sen University, Business School, Guangzhou, China (and 1 more)
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Conference and Workshop Papers
- 2009
- [c6]Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz:
N-distinguishing Tests for Enhanced Defect Diagnosis. Asian Test Symposium 2009: 183-186 - 2006
- [c5]Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski:
A test pattern ordering algorithm for diagnosis with truncated fail data. DAC 2006: 399-404 - [c4]Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski:
New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic. VLSI Design 2006: 419-424 - 2005
- [c3]Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz:
Defect Aware Test Patterns. DATE 2005: 450-455 - [c2]Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker:
A unified fault model and test generation procedure for interconnect opens and bridges. ETS 2005: 22-27 - 2003
- [c1]Gang Chen, Sudhakar M. Reddy, Irith Pomeranz:
Procedures for Identifying Untestable and Redundant Transition Faults in Synchronous Sequential Circuits. ICCD 2003: 36-41
Coauthor Index
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