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ORCIDHan Wang 0013
Person information
- affiliation: Beihang University, School of Reliability and Systems Engineering, Beijing, China
Other persons with the same name
- Han Wang — disambiguation page
- Han Wang 0001
![[0000-0001-5448-9903]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0001-5448-9903")
— Nanyang Technological University, School of Electrical and Electronic Engineering, Singapore (and 1 more) - Han Wang 0002 — University of Illinois at Urbana-Champaign, Department of Electrical and Computer Engineering, IL, USA
- Han Wang 0003 — School of Information Science and Engineering, Northeastern University (NEU), Shenyang, China
- Han Wang 0004 — National University of Ireland, Galway, UK
- Han Wang 0005 — Yichun University, College of Physical Science and Engineering, Jiangxi, China (and 2 more)
- Han Wang 0006 — Institute of Applied Physics and Computational Mathematics, Beijing, China (and 2 more)
- Han Wang 0007 — Dalian University of Technology, School of Mathematical Sciences, China
- Han Wang 0008 — Massachusetts Institute of Technology, Cambridge, MA, USA
- Han Wang 0009 — Cornell University, Department of Computer Science, Ithaca, NY, USA
- Han Wang 0010 — Northwestern Polytechnical University, Research and Development Institute, School of Marine Science and Technology, Xi'an, China
- Han Wang 0011 — University of Texas, Department of Computer Science, Institute for Cyber Security, San Antonio, TX, USA (and 1 more)
- Han Wang 0012 — Zhejiang University, College of Biomedical Engineering & Instrument Science, Hangzhou, China
- Han Wang 0014 — Nanyang Technological University, School of Electrical and Electronic Engineering, Singapore
- Mini Han Wang (aka: Han Wang 0015) — City Univerity of Macau, Institute of Data Science, Macao (and 1 more)
- Han Wang 0016 — Columbia University, NY, USA
- Han Wang 0017 — Guangdong University of Technology, State Key Laboratory of Precision Electronic Manufacturing Technology and Equipment, China
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2020 – today
- 2023
[j10]Bingxin Yan, Han Wang, Xiaobing Ma:
Correlation-driven multivariate degradation modeling and RUL prediction based on Wiener process model. Qual. Reliab. Eng. Int. 39(8): 3203-3229 (2023)- [j9]Kewei Ye, Han Wang, Xiaobing Ma:
A generalized dynamic stress-strength interference model under δ-failure criterion for self-healing protective structure. Reliab. Eng. Syst. Saf. 229: 108838 (2023) - 2022
- [j8]Han Wang, Haitao Liao, Xiaobing Ma:
Stochastic Multi-phase Modeling and Health Assessment for Systems Based on Degradation Branching Processes. Reliab. Eng. Syst. Saf. 222: 108412 (2022) - 2021
- [j7]Han Wang, Haitao Liao, Xiaobing Ma, Rui Bao:
Remaining Useful Life Prediction and Optimal Maintenance Time Determination for a Single Unit Using Isotonic Regression and Gamma Process Model. Reliab. Eng. Syst. Saf. 210: 107504 (2021) - [j6]Han Wang, Haitao Liao, Xiaobing Ma:
Remaining Useful Life Prediction Considering Joint Dependency of Degradation Rate and Variation on Time-Varying Operating Conditions. IEEE Trans. Reliab. 70(2): 761-774 (2021) - 2020
- [j5]Bingxin Yan, Xiaobing Ma, Li Yang, Han Wang, Tianyi Wu:
A novel degradation-rate-volatility related effect Wiener process model with its extension to accelerated ageing data analysis. Reliab. Eng. Syst. Saf. 204: 107138 (2020)
2010 – 2019
- 2019
- [j4]Han Wang, Yu Zhao, Xiaobing Ma, Zhihua Wang:
A novel pseudo-maximum likelihood estimation method for accelerated degradation tests under Wiener process. Qual. Reliab. Eng. Int. 35(1): 304-317 (2019) - 2018
- [j3]Han Wang, Yu Zhao, Xiaobing Ma:
Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process. IEEE Access 6: 4440-4451 (2018) - [c1]Han Wang, Yu Zhao, Xiaobing Ma:
A Multi-objective Framework for Designing Accelerated Degradation Tests Under Wiener Process Model. IEEM 2018: 1709-1713 - 2017
- [j2]Han Wang, Yu Zhao, Xiaobing Ma, Li Yang:
Equivalence analysis of accelerated degradation mechanism based on stochastic degradation models. Qual. Reliab. Eng. Int. 33(8): 2281-2294 (2017) - [j1]Han Wang, Yu Zhao, Xiaobing Ma, Hongyu Wang:
Optimal design of constant-stress accelerated degradation tests using the M-optimality criterion. Reliab. Eng. Syst. Saf. 164: 45-54 (2017)
Coauthor Index
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