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ORCIDMohammed N. Afsar
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Journal Articles
- 2010
[j12]Zijing Li, A. Sharma, A. I. M. Ayala, Mohammed N. Afsar, Konstantin A. Korolev:
Broadband Dielectric Measurements on Highly Scattering Materials. IEEE Trans. Instrum. Meas. 59(5): 1397-1405 (2010)- [j11]Konstantin A. Korolev, Shu Chen, Zijing Li, Mohammed N. Afsar:
Millimeter-Wave Transmittance and Reflectance Measurement on Pure and Diluted Carbonyl Iron. IEEE Trans. Instrum. Meas. 59(8): 2198-2203 (2010) - 2009
- [j10]Shu Chen, Konstantin A. Korolev, Joshua Kupershmidt, Kim Nguyen, Mohammed N. Afsar:
High-Resolution High-Power Quasi-Optical Free-Space Spectrometer for Dielectric and Magnetic Measurements in Millimeter Waves. IEEE Trans. Instrum. Meas. 58(8): 2671-2678 (2009) - 2008
- [j9]Usman A. Khan, Nicholas Nguyen, Mohammed N. Afsar:
Millimeter- and Submillimeter-Wave Dielectric Measurements of Household Powders Using Fourier Transform Spectroscopy. IEEE Trans. Instrum. Meas. 57(2): 286-293 (2008) - [j8]Shu Chen, Mohammed N. Afsar, D. Sakdatorn:
Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths. IEEE Trans. Instrum. Meas. 57(4): 706-715 (2008) - [j7]Konstantin A. Korolev, Shu Chen, Mohammed N. Afsar:
Millimeter-Wave Transmittance Measurements on Ferrites Near Ferromagnetic Resonance. IEEE Trans. Instrum. Meas. 57(7): 1388-1393 (2008) - 2007
- [j6]Usman A. Khan, Mohammed N. Afsar:
Measurement of Broadband Dielectric Properties of Cyclohexane, Chlorobenzene, 10% Formalin, and 1, 4-Dioxane Using Dispersive Fourier Transform Spectroscopy. IEEE Trans. Instrum. Meas. 56(6): 2354-2359 (2007) - 2006
- [j5]Nawaf N. Almoayed, Mohammed N. Afsar:
High-resolution absorption coefficient and refractive index spectra of carbon monoxide gas at millimeter and submillimeter wavelengths. IEEE Trans. Instrum. Meas. 55(4): 1033-1037 (2006) - 2004
- [j4]Mohammed N. Afsar, Anusha Moonshiram, Yong Wang:
Assessment of random and systematic errors in millimeter-wave dielectric measurement using open resonator and Fourier transform spectroscopy systems. IEEE Trans. Instrum. Meas. 53(4): 899-906 (2004) - 2001
- [j3]Mohammed N. Afsar, Hanyi Ding:
A novel open-resonator system for precise measurement of permittivity and loss-tangent. IEEE Trans. Instrum. Meas. 50(2): 402-405 (2001) - 1999
- [j2]Mohammed N. Afsar, Hanyi Ding, Khaled Tourshan:
A new 60 GHz open-resonator technique for precision permittivity and loss-tangent measurement. IEEE Trans. Instrum. Meas. 48(2): 626-630 (1999) - 1985
- [j1]Mohammed N. Afsar, Kenneth J. Button:
Millimeter-wave dielectric measurement of materials. Proc. IEEE 73(1): 131-153 (1985)
Conference and Workshop Papers
- 2018
- [c5]Wei Quan, Mohammed N. Afsar:
Ultra high-Q 60GHz open resonator system for precision dielectric permittivity and loss tangent measurements. I2MTC 2018: 1-5 - [c4]Wei Quan, Mohammed N. Afsar, Jonathan Card:
Measurement of resonant cavity for propellantless microwave thrusters at radio frequency. I2MTC 2018: 1-5 - 2013
- [c3]Liu Chao, Mohammed N. Afsar, Michael A. Zimmerman
, Anil Saigal:
Non-contact dielectric characterization of lithium ionic solid electrolyte polymer. I2MTC 2013: 925-930 - [c2]Anjali Sharma, Mohammed N. Afsar:
Measurement technique for characterizing constitutive material properties of thin films. I2MTC 2013: 1261-1265 - [c1]Liu Chao, Mohammed N. Afsar:
Complex dielectric permittivity and magnetic permeability measurement of ferrite powders at millimeter wavelength. I2MTC 2013: 1564-1566
Coauthor Index
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