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2010 – 2019

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2010
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Antonio Testa, Salvatore De Caro, Saverio Panarello, Salvatore Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor:
Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectron. Reliab. 50(9-11): 1789-1795 (2010)

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