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2004
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Yeong-Chang Chou, D. Leung, Ioulia Smorchkova, Mike Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng:
Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectron. Reliab. 44(7): 1033-1038 (2004)

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