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David I. Bergman

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Journal Articles

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2006
[j4]
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  - journals/tim/BergmanS06
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David I. Bergman, Gerard N. Stenbakken:
Phase-plane-derived distortion modeling of a fast and accurate digitizing sampler. IEEE Trans. Instrum. Meas. 55(4): 1094-1100 (2006)
2005
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Donald R. Larson, Nicholas G. Paulter Jr., David I. Bergman:
Pulse parameter dependence on transition occurrence instant and waveform epoch. IEEE Trans. Instrum. Meas. 54(4): 1520-1526 (2005)
2004
[j2]
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David I. Bergman:
Dynamic error correction of a digitizer for time-domain metrology. IEEE Trans. Instrum. Meas. 53(5): 1384-1390 (2004)
2003
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David I. Bergman, Bryan C. Waltrip:
A low-noise latching comparator probe for waveform sampling applications. IEEE Trans. Instrum. Meas. 52(4): 1107-1113 (2003)

Conference and Workshop Papers

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2004
[c2]
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David I. Bergman, Bryan C. Waltrip:
Low thermal error sampling comparator for accurate settling measurements. ISCAS (1) 2004: 521-524
2002
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David I. Bergman, Hans Engler:
Improved IDDQ Testing with Empirical Linear Prediction. ITC 2002: 954-963

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