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J. Hemery

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2010 – 2019

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2010
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Christian Moreau, M. Le Pipec, S. Tence, J. Hemery, J. Rigo, C. Guérin, D. Ruelloux, C. Schneider, P. Le Helleye:
A complete methodology for assessing GaN behaviour for military applications. Microelectron. Reliab. 50(9-11): 1587-1592 (2010)

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