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Yuden Teraoka

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2005
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Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh, Yuden Teraoka, Akitaka Yoshigoe:
Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si<1 0 0> systems. Microelectron. Reliab. 45(1): 57-64 (2005)

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