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Anton Karputkin

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2010 – 2019

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2016
[c4]
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Anton Karputkin, Jaan Raik:
A synthesis-agnostic behavioral fault model for high gate-level fault coverage. DATE 2016: 1124-1127
2012
[j1]
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Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara:
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints. J. Electron. Test. 28(4): 511-521 (2012)
[c3]
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Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik:
Automated correction of design errors by edge redirection on High-Level Decision Diagrams. ISQED 2012: 686-693
2011
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Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik:
Probabilistic equivalence checking based on high-level decision diagrams. DDECS 2011: 423-428
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Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik:
Interactive presentation abstract: Automated correction of design errors by edge redirection on high-level decision diagrams. HLDVT 2011: 83

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