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Diane S. Moebus

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1992
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Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong:
Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992)

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