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G. Chaplier

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2011
[j1]
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Tien Anh Nguyen, Pierre-Yves Joubert, Stéphane Lefebvre, G. Chaplier, Lionel Rousseau:
Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique. Microelectron. Reliab. 51(6): 1127-1135 (2011)

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