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Peter G. Muzykov

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2000 – 2009

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2009
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Peter G. Muzykov, Robert M. Kennedy, Qingchun Zhang, Craig Capell, Al Burk, Anant Agarwal, Tangali S. Sudarshan:
Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors. Microelectron. Reliab. 49(1): 32-37 (2009)

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