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Ming-Jaan Wang

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Journal Articles

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2011
[j2]
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  - journals/mr/YuYWW11
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  - https://dblp.org/rec/journals/mr/YuYWW11
Fong-Jung Yu, Yung-Yu Yang, Ming-Jaan Wang, Zhang Wu:
Using EWMA control schemes for monitoring wafer quality in negative binomial process. Microelectron. Reliab. 51(2): 400-405 (2011)
2005
[j1]
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Ming-Jaan Wang, Michael H. Hu, Meei-Yuh Ku:
A solution to the unequal area facilities layout problem by genetic algorithm. Comput. Ind. 56(2): 207-220 (2005)

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