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2020 – today
- 2024
[c7]Junfeng Tan, Guosheng Yu, Jianing Li, Xiaohan Ma, Fang Bao, Evens Pan, David Bian, Yongfu Li, Yuan Du, Li Du, Bo Li, Wei Mao:
AICAS Grand Challenge 2024: Software and Hardware Co-optimization for General Large Language Model Inference on CPU. AICAS 2024: 1-5
2010 – 2019
- 2019
- [j3]Yuehong (Helen) Zhang
, Fang Bao, Jian Wu, Hanfeng Lin:
Reflections on the international impact of Chinese STM journals. Learn. Publ. 32(2): 126-136 (2019) - [c6]Fang Bao, Michael Neumann, Ngoc Thang Vu:
CycleGAN-Based Emotion Style Transfer as Data Augmentation for Speech Emotion Recognition. INTERSPEECH 2019: 2828-2832 - 2013
- [j2]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor:
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. 29(1): 35-48 (2013) - [j1]Fang Bao, Ke Peng, Mohammad Tehranipoor, Krishnendu Chakrabarty:
Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(10): 1583-1594 (2013) - [c5]Fang Bao, Mohammad Tehranipoor, Harry H. Chen:
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise. Asian Test Symposium 2013: 37-42 - 2011
- [c4]Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor:
On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Asian Test Symposium 2011: 120-125 - [c3]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor:
Critical Fault-Based Pattern Generation for Screening SDDs. ETS 2011: 177-182 - [c2]Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor:
Case Study: Efficient SDD test generation for very large integrated circuits. VTS 2011: 78-83
2000 – 2009
- 2007
- [c1]Yonghui Pan, Fang Bao, Shitong Wang:
Supervised FCNN Classification for Garment Seams. CIS 2007: 555-559
Coauthor Index
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