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Patrick Gorria
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2010 – 2019
- 2012
- [j7]Youssef Bokhabrine, Ralph Seulin, Lew Fock Chong Lew Yan Voon, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard:
3D characterization of hot metallic shells during industrial forging. Mach. Vis. Appl. 23(3): 417-425 (2012)
2000 – 2009
- 2007
- [c10]Thierry Molinier, David Fofi, Patrick Gorria, Joaquim Salvi
:
Automatic texture mapping on real 3D model. CVPR 2007 - 2006
- [c9]Olivier Morel, Mathias Ferraton, Christophe Stolz, Patrick Gorria:
Active Lighting Applied to Shape from Polarization. ICIP 2006: 2181-2184 - 2004
- [j6]Pierrick Bourgeat
, Fabrice Mériaudeau, Kenneth W. Tobin
, Patrick Gorria:
Content based segmentation of patterned wafers. J. Electronic Imaging 13(3): 428-435 (2004) - [j5]Olivier Aubreton, Benaissa Bellach
, Lew Fock Chong Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras:
Retina for pattern matching in standard 0.6-µm complementary metal oxide semiconductor technology. J. Electronic Imaging 13(3): 559-569 (2004) - [c8]Pierrick Bourgeat
, Fabrice Mériaudeau, Patrick Gorria, Kenneth W. Tobin
, Frédéric Truchetet:
Features extraction on complex images. ICIP 2004: 219-222 - 2002
- [j4]Ralph Seulin, Fred Merienne
, Patrick Gorria:
Simulation of Specular Surface Imaging Based on Computer Graphics: Application on a Vision Inspection System. EURASIP J. Adv. Signal Process. 2002(7): 649-658 (2002) - [j3]Denis Aluze, Fred Merienne
, Christophe Dumont, Patrick Gorria:
Vision system for defect imaging, detection, and characterization on a specular surface of a 3D object. Image Vis. Comput. 20(8): 569-580 (2002) - [c7]Khalil Maalmi
, A. El-Ouaazizi, Rachid Benslimane
, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria:
Detecting parabolas in ultrasound B-scan images with Genetic-Based Inverse Voting Hough Transform. ICASSP 2002: 3337-3340 - [c6]Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria:
Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform. ICPR (3) 2002: 257-260 - 2001
- [j2]Gaëtan Delcroix, Ralph Seulin, Bernard Lamalle, Patrick Gorria, Fred Merienne
:
Study of the imaging conditions and processing for the aspect control of specular surfaces. J. Electronic Imaging 10(1): 196-202 (2001) - [j1]Anne-Claire Legrand, Pierre Suzeau, Eric Renier, Frédéric Truchetet, Patrick Gorria, Fabrice Mériaudeau:
Machine vision systems in the metallurgy industry. J. Electronic Imaging 10(1): 274-282 (2001) - [c5]Bernard Lamalle, Guy Cathébras, Lew Fock Chong Lew Yan Voon, Patrick Gorria, Benaissa Bellach
, Olivier Aubreton:
A correlation retina for real-time pattern recognition. ETFA (2) 2001: 367-372 - [c4]Eric Fauvet, Lew Fock Chong Lew Yan Voon, Fred Nicolier, Patrick Gorria, Frédéric Truchetet:
Optimizing the Factorisation of 2D Filters by Genetic Algorithm. VIIP 2001: 676-681 - 2000
- [c3]Anne-Claire Legrand, Patrick Gorria, Fabrice Mériaudeau:
Active infrared nondestructive testing for glue occlusion detection in plastic cap. KES 2000: 381-384
1990 – 1999
- 1997
- [c2]Johel Mitéran, Remy Bailly, Patrick Gorria:
Classification board for real time image segmentation. ICASSP 1997: 4069-4072 - 1994
- [c1]Michel Robert, Patrick Gorria, Johel Mitéran, S. Turgis:
Design of a Real Time Geometric Classifier. EDAC-ETC-EUROASIC 1994: 656
Coauthor Index
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