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P. Schwindenhammer

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Journal Articles

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2008
[j2]
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P. Schwindenhammer, H. Murray, Philippe Descamps, Patrick Poirier:
Determination of temperature change inside IC packages during laser ablation of molding compound. Microelectron. Reliab. 48(8-9): 1263-1267 (2008)
2002
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Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42(9-11): 1449-1452 (2002)

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