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Ying Jin 0010

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affiliation: Chartered Semiconductor Manufacturing, Singapore

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2000 – 2009

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2002
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Gang Chen, Ming Fu Li, Ying Jin:
Interaction of interface-traps located at various sites in MOSFETs under stress. IEEE Trans. Reliab. 51(4): 387-391 (2002)
2001
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Gang Chen, Ming Fu Li, Ying Jin:
Electric passivation of interface traps at drain junction space charge region in p-MOS transistors. Microelectron. Reliab. 41(9-10): 1427-1431 (2001)

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