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C. H. Loh
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Journal Articles
- 2009
- [j2]W. S. Lau, Peizhen Yang, Jason Zhiwei Chian, V. Ho, C. H. Loh, S. Y. Siah, L. Chan:
Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. Microelectron. Reliab. 49(1): 1-7 (2009) - 2008
- [j1]W. S. Lau, Peizhen Yang, C. W. Eng, V. Ho, C. H. Loh, S. Y. Siah, D. Vigar, L. Chan:
A study of the linearity between Ion and log Ioff of modern MOS transistors and its application to stress engineering. Microelectron. Reliab. 48(4): 497-503 (2008)
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