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José Vicente Calvano
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2000 – 2009
- 2007
- [j2]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007) - [i1]Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho:
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. CoRR abs/0710.4725 (2007) - 2006
- [c15]Carlos E. F. Savioli, Claudio E. C. Szendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho:
Using Swarm Intelligence to Solve Some Analog Test Issues. LATW 2006: 25-29 - [c14]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - 2005
- [c13]Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho:
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. DATE 2005: 174-175 - 2004
- [c12]Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho:
ATPG for fault diagnosis on analog electrical networks using evolutionary techniques. SBCCI 2004: 100-104 - 2003
- [c11]José Vicente Calvano, Marcelo Lubaszewski:
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256 - 2002
- [c10]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. LATW 2002: 83-85 - [c9]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves:
State Model Approach for Analog Fault Modeling. LATW 2002: 86-88 - [c8]José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski:
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206 - 2001
- [j1]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17(2): 121-138 (2001) - [c7]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Filter Sensitivity Analysis Using the TRAM. LATW 2001: 80-83 - [c6]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing Testable Networks for Transfer Function Realization. LATW 2001: 84-87 - 2000
- [c5]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96- - [c4]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski:
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. LATW 2000: 84-87 - [c3]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
The Use of Macromodels on Op-Amp Circuits Fault Modeling. LATW 2000: 188-192 - [c2]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho:
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI 2000: 289-294 - [c1]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324
Coauthor Index
aka: Marcelo Soares Lubaszewski
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