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Kenta Sutoh

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2010 – 2019

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2010
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  - journals/ieicet/IchiharaSYI10
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Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue:
A Practical Threshold Test Generation for Error Tolerant Application. IEICE Trans. Inf. Syst. 93-D(10): 2776-2782 (2010)

2000 – 2009

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2009
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Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue:
A Practical Approach to Threshold Test Generation for Error Tolerant Circuits. Asian Test Symposium 2009: 171-176

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