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ORCIDHongjoong Shin
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2010 – 2019
- 2011
[j3]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27(3): 321-334 (2011)- 2010
- [j2]Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electron. Test. 26(1): 73-86 (2010)
2000 – 2009
- 2008
- [c10]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Parallel Loopback Test of Mixed-Signal Circuits. VTS 2008: 309-316 - 2007
- [j1]Byoungho Kim
, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Predicting mixed-signal dynamic performance using optimised signature-based alternate test. IET Comput. Digit. Tech. 1(3): 159-169 (2007) - [c9]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. ISQED 2007: 495-500 - 2006
- [c8]Minsik Cho, Hongjoong Shin, David Z. Pan:
Fast substrate noise-aware floorplanning with preference directed graph for mixed-signal SOCs. ASP-DAC 2006: 765-770 - [c7]Hongjoong Shin, Jiseon Park, Jacob A. Abraham:
A Statistical Digital Equalizer for Loopback-based Linearity Test of Data Converters. ATS 2006: 245-250 - [c6]Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. ETS 2006: 199-204 - [c5]Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. ITC 2006: 1-10 - [c4]Hongjoong Shin, Byoungho Kim, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS 2006: 412-419 - 2004
- [c3]Hongjoong Shin, Hak-soo Yu, Jacob A. Abraham:
LFSR-based BIST for analog circuits using slope detection. ACM Great Lakes Symposium on VLSI 2004: 316-321 - [c2]Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. ITC 2004: 1389-1397 - [c1]Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee:
Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS 2004: 377-382
Coauthor Index
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