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P. L. Eu

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2008
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Ee-Hua Wong, Ranjan Rajoo, S. K. W. Seah, C. S. Selvanayagam, W. D. van Driel, J. F. J. M. Caers, X. J. Zhao, N. Owens, L. C. Tan, M. Leoni, P. L. Eu, Y.-S. Lai, C.-L. Yeh:
Correlation studies for component level ball impact shear test and board level drop test. Microelectron. Reliab. 48(7): 1069-1078 (2008)

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