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2020 – today
- 2025
[i1]Gerd Kortemeyer, Marina Babayeva
, Giulia Polverini, Bor Gregorcic, Ralf Widenhorn:
Multilingual Performance of a Multimodal Artificial Intelligence System on Multisubject Physics Concept Inventories. CoRR abs/2501.06143 (2025)- 2021
- [e11]Jon S. McElvain, Arnaud Peizerat, Nitin Sampat, Ralf Widenhorn:
Imaging Sensors and Systems 2021, online, January 11-28, 2021. Society for Imaging Science and Technology 2021 [contents] - 2020
- [e10]Jon S. McElvain, Arnaud Peizerat, Nitin Sampat, Ralf Widenhorn:
Imaging Sensors and Systems 2020, Burlingame, CA, USA, January 26-30, 2020. Society for Imaging Science and Technology 2020 [contents]
2010 – 2019
- 2019
- [e9]Arnaud Darmont, Arnaud Peizerat, Ralf Widenhorn:
Image Sensors and Imaging Systems 2019, IMSE 2019, Burlingame, CA, USA, January 13-17, 2019. Society for Imaging Science and Technology 2019 [contents] - 2018
- [e8]Arnaud Darmont, Ralf Widenhorn:
Image Sensors and Imaging Systems 2018, IMSE 2018, Burlingame, CA, USA, January 28 - February 1, 2018. Society for Imaging Science and Technology 2018 [contents] - 2017
- [e7]Arnaud Darmont, Ralf Widenhorn:
Image Sensors and Imaging Systems 2017, IMSE 2017, Burlingame, CA, USA, January 29 - February 2, 2017. Society for Imaging Science and Technology 2017 [contents] - 2016
- [e6]Arnaud Darmont, Antoine Dupret, Ralf Widenhorn:
Image Sensors and Imaging Systems 2016, IMSE 2016, San Francisco, CA, USA, February 14-18, 2016. Society for Imaging Science and Technology 2016 [contents] - 2015
- [e5]Ralf Widenhorn, Antoine Dupret:
Image Sensors and Imaging Systems 2015, San Francisco, California, United States, 8-12 February 2015. SPIE Proceedings 9403, SPIE 2015, ISBN 9781628414936 [contents] - 2014
- [e4]Ralf Widenhorn, Antoine Dupret:
Image Sensors and Imaging Systems 2014, San Francisco, California, USA, February 2-6, 2014. SPIE Proceedings 9022, SPIE 2014, ISBN 9780819499394 [contents] - 2013
- [e3]Ralf Widenhorn, Antoine Dupret:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013. SPIE Proceedings 8659, SPIE 2013, ISBN 9780819494320 [contents] - 2012
- [j4]Justin C. Dunlap, Morley M. Blouke, Erik Bodegom, Ralf Widenhorn:
Dark current modeling with a moving depletion edge. J. Electronic Imaging 21(4): 043011 (2012) - [c2]Justin C. Dunlap, Morley M. Blouke, Erik Bodegom, Ralf Widenhorn:
Dynamic CCD pixel depletion edge model and the effects on dark current production. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2012: 82980F - [e2]Ralf Widenhorn, Valérie Nguyen, Antoine Dupret:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, California, USA, January 22-26, 2012. SPIE Proceedings 8298, SPIE 2012, ISBN 9780819489456 [contents] - 2011
- [j3]Justin C. Dunlap, William C. Porter, Erik Bodegom, Ralf Widenhorn:
Dark current in an active pixel complementary metal-oxide-semiconductor sensor. J. Electronic Imaging 20(1): 013005 (2011) - [c1]Justin C. Dunlap, Erik Bodegom, Ralf Widenhorn:
Nonlinear time dependence of dark current in charge-coupled devices. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750H - [e1]Ralf Widenhorn, Valérie Nguyen:
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII, San Francisco Airport, California, USA, January 23-27, 2011. SPIE Proceedings 7875, SPIE 2011, ISBN 9780819484123 [contents] - 2010
- [j2]Justin C. Dunlap, Erik Bodegom, Ralf Widenhorn:
Correction of dark current in consumer cameras. J. Electronic Imaging 19(1): 013010 (2010)
2000 – 2009
- 2009
- [j1]Ralf Widenhorn, Ines Hartwig, Justin C. Dunlap, Erik Bodegom:
Influence of illumination on dark current in charge-coupled device imagers. J. Electronic Imaging 18(3): 033015 (2009)
Coauthor Index
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