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2020 – today
- 2024
[j6]Jim-Wei Wu
, Hang-Kai Ye, Jia-Cheng Li, Jung-Yu Liao:
Agent-Like Model for the Fusion of Attention Features for the Extraction of Joint-Entity Relations. IEEE Access 12: 165497-165506 (2024)- [c14]Jim-Wei Wu, Yu-Chen Lin, Ko-Fan Teng, Chuan-An Chou, You-Cheng Yan, Hang-Kai Ye:
A New Image Stitching Method with Entropy and Template Matching. ICCE 2024: 1-6 - 2023
- [j5]Jim-Wei Wu, Tzu-Lin Lee, You-Cheng Yan, Chuan-An Chou, Cheng-Chang Ho:
Mechanism Development and Pulse-Width Modulation Advanced Controller Design of Low Torque Manipulator. IEEE Access 11: 117110-117120 (2023) - [j4]Jim-Wei Wu, Shao-An Chao, Ting-Kuei Hsu:
Design and Control of a Novel 3-D Piezoelectric Scanning Coaxial Optical Microscope System. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - 2022
- [j3]Jim-Wei Wu, Kuang-Yao Chang, Li-Chen Fu:
Adaptive Under-Sampling Deep Neural Network for Rapid and Reliable Image Recovery in Confocal Laser Scanning Microscope Measurements. IEEE Trans. Instrum. Meas. 71: 1-9 (2022) - [j2]Jim-Wei Wu, Wei-Chih Liu, Li-Chen Fu:
Novel Vertical Scanning Algorithm With Advanced Control to Increase Range and Accuracy of Differential Confocal Microscopy. IEEE Trans. Instrum. Meas. 71: 1-10 (2022) - [c13]Jim-Wei Wu, Wen-Shan Cen, Tzu-Lin Lee, Yu-Chen Lin, Bo-Jun Chen:
Modeling and Advanced Controller for Precise Control of Dual-Axis Manipulator. iFUZZY 2022: 1-6 - 2021
- [c12]Jim-Wei Wu, Cheng-Chia Wu, Wen-Shan Cen, Shao-An Chao, Jui-Tse Weng:
Integrated Compressed Sensing and YOLOv4 for Application in Image-storage and Object-recognition of Dashboard Camera. ANZCC 2021: 7-11
2010 – 2019
- 2018
- [c11]Da-Wei Liu, Huang-Chih Chen, Kuang-Yao Chang, Meng-Hao Chou, Yi-Lin Liu, Jim-Wei Wu, Ming-Li Chiang, Li-Chen Fu:
Design of a High-speed and High-precision Hybrid Scanner with a New Path Planning Strategy Based on Spatial Entropy. ACC 2018: 2946-2951 - 2017
- [c10]Kuang-Yao Chang, Yi-Lin Liu, Da-Wei Liu, Meng-Hao Chou, Jim-Wei Wu, Li-Chen Fu:
A fast CLSM undersampling image reconstruction framework with precise stage positioning for random measurements. ASCC 2017: 1122-1127 - 2016
- [c9]Yu-Ting Lo, Jim-Wei Wu, Wei-Chih Liu, Da-Wei Liu, Kuang-Yao Chang, Li-Chen Fu:
Adaptive tilting angles for a dual-probe AFM system to increase image accuracy. AIM 2016: 1318-1223 - 2014
- [j1]Jim-Wei Wu, Kuan-Chia Huang, Ming-Li Chiang, Mei-Yung Chen, Li-Chen Fu:
Modeling and Controller Design of a Precision Hybrid Scanner for Application in Large Measurement-Range Atomic Force Microscopy. IEEE Trans. Ind. Electron. 61(7): 3704-3712 (2014) - [c8]Yi-Ting Lin, Yu-Ting Lo, Jim-Wei Wu, Wei-Chih Liu, Li-Chen Fu:
A dual probes AFM system with effective tilting angles to achieve high-precision scanning. CDC 2014: 6801-6806 - 2013
- [c7]Jim-Wei Wu, Jyun-Jhih Chen, Kuan-Chia Huang, Chih-Lieh Chen, Yi-Ting Lin, Mei-Yung Chen, Li-Chen Fu:
Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments. ACC 2013: 5488-5493 - [c6]Chih-Lieh Chen, Jim-Wei Wu, Yi-Ting Lin, Yu-Ting Lo, Li-Chen Fu:
Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy. CDC 2013: 348-353 - 2012
- [c5]Jim-Wei Wu, Yuan-Zhi Peng, Jyun-Jhih Chen, Kuan-Chia Huang, Mei-Yung Chen, Li-Chen Fu:
Design and implementation of a large measurement-range AFM scanning system. ACC 2012: 895-900 - [c4]Kuan-Chia Huang, Jim-Wei Wu, Jyun-Jhih Chen, Chih-Lieh Chen, Mei-Yung Chen, Li-Chen Fu:
Development of a large scanning-range atomic force microscope with adaptive complementary sliding mode controller. CDC 2012: 1685-1690 - 2011
- [c3]Kuan-Lin Huang, Yuan-Zhi Peng, Jim-Wei Wu, Mei-Yung Chen, Li-Chen Fu:
Design and implementation of an electromagnetically damped positioner with flexure suspension. CCA 2011: 1062-1067 - 2010
- [c2]Shan-Tsung Lee, Kuan-Lin Huang, Jim-Wei Wu, Li-Chen Fu:
Design and Control of Long Travel Range Electromagnetically Actuated Positioning Stage with Application to Precise machining. CCA 2010: 2219-2224 - [c1]Shih-Hsun Yen, Jim-Wei Wu, Li-Chen Fu:
Apply tapping mode Atomic Force Microscope with CD/DVD pickup head in fluid. ACC 2010: 6549-6554
Coauthor Index
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