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Bruce T. Neel

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1990 – 1999

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1990
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Clinton Kuo, Thomas Toms, Bruce T. Neel, Joe Jelemensky, Ernest A. Carter, Philip Smith:
Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM. IEEE J. Solid State Circuits 25(1): 61-67 (1990)

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