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Sebastian Selter

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2024
[j1]
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Ivan Soldatov, Burak Özer, Saicharan Aswartham, Sebastian Selter, Louis Veyrat, Bernd Büchner, Rudolf Schäfer:
Wide-Field Kerr Microscopy and Magnetometry on Cr₂Ge₂Te₆ Exfoliated van-der-Waals Flakes. IEEE Access 12: 181025-181040 (2024)

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