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Ertan Baykal

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Conference and Workshop Papers

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2012
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  - conf/apccas/OwzarBFZSHB12
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A. Owzar, Ertan Baykal, P. Felicio, T. Zheng, Ralph Stephan, Markus Helfenstein, Rolf Becker:
SOI vs. bulk for wireless application. APCCAS 2012: 324-327
2005
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Markus Helfenstein, Ertan Baykal, Kurt Müller, Alexander Lampe:
Error vector magnitude (EVM) measurements for GSM/EDGE applications revised under production conditions. ISCAS (5) 2005: 5003-5006

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