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C. E. Glaser

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2024
[c1]
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B. D. Rummel, C. E. Glaser, R. T. Gurule, M. Groves, A. T. Binder, R. Floyd, L. Yates, K. J. Reilly, R. J. Kaplar:
Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H³TRB Testing. IRPS 2024: 52

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