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Leen Van Doorselaer

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Conference and Workshop Papers

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2023
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Astrid Tempelaere, Leen Van Doorselaer, Jiaqi He, Pieter Verboven, Tinne Tuytelaars, Bart M. Nicolaï:
Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging. ICCV (Workshops) 2023: 552-560

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