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Martin J. Bayer

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2010 – 2019

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2016
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Munaf Rahimo, Frank Richter, Fabian Fischer, Umamaheswara Vemulapati, Arnost Kopta, Chiara Corvasce, Silvan Geissmann, Marco Bellini, Martin J. Bayer, Friedhelm Bauer:
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. Microelectron. Reliab. 58: 51-57 (2016)

2000 – 2009

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2005
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Michael Stockinger, James W. Miller, Michael G. Khazhinsky, Cynthia A. Torres, James C. Weldon, Bryan D. Preble, Martin J. Bayer, Matthew D. Akers, Vishnu G. Kamat:
Advanced rail clamp networks for ESD protection. Microelectron. Reliab. 45(2): 211-222 (2005)

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