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Richard F. Herlein

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Conference and Workshop Papers

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2005
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Ahmed Syed, Richard F. Herlein, Ben Cain, Frank Sauk:
Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy. ITC 2005: 7
1993
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Richard F. Herlein:
Terminating Transmission lines in the Test Environment. ITC 1993: 936-944
1983
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Richard F. Herlein:
Optimizing the Timing Architecture of a Digital LSI Test System. ITC 1983: 200-211

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