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P. C. Feijoo

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2011
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P. C. Feijoo, Moonju Cho, Mitsuhiro Togo, E. San Andrés, Guido Groeseneken:
Positive bias temperature instabilities on sub-nanometer EOT FinFETs. Microelectron. Reliab. 51(9-11): 1521-1524 (2011)

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