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Kia Wei Kee

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2023
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Kia Wei Kee, King Hann Lim, Chin Hong Lim, Wen Loong Lim, Huei Ee Yap:
Cracks identification using mask region-based denoised deformable convolutional network. Multim. Tools Appl. 82(3): 4387-4404 (2023)

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