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Kenneth R. Bowden

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Conference and Workshop Papers

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1985
[c4]
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  dblp key:
  - conf/itc/GilesBHM85
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David Giles, Kenneth R. Bowden, Mike Haney, Gregory A. Maston:
Maintaining Simulation Accuracy through Physical Device Models. ITC 1985: 692-695
[c3]
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Jeremy Richman, Kenneth R. Bowden:
The Modern Fault Dictionary. ITC 1985: 696-702
1982
[c2]
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Kenneth R. Bowden:
Design Goals and Implementation Techniques for Time-Based Digital Simulation and Hazard Detection. ITC 1982: 147-152
[c1]
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  - conf/itc/LevineBBBKGRW82
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Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks:
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

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