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B. Martinet

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2005
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P. Benoit, Jérémy Raoult, C. Delseny, Fabien Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, Olivier Noblanc:
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectron. Reliab. 45(9-11): 1800-1806 (2005)

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