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Peter Seegebrecht

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Journal Articles

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2005
[j3]
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  - journals/jssc/ArnimBSFBTBP05
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  - https://dblp.org/rec/journals/jssc/ArnimBSFBTBP05
Klaus von Arnim, Eduardo Borinski, Peter Seegebrecht, Horst Fiedler, Ralf Brederlow, Roland Thewes, Jörg Berthold, Christian Pacha:
Efficiency of body biasing in 90-nm CMOS for low-power digital circuits. IEEE J. Solid State Circuits 40(7): 1549-1556 (2005)
2001
[j2]
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  - journals/mr/Zahlmann-NowitzkiNS01
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Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht:
On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectron. Reliab. 41(7): 1067-1069 (2001)
[j1]
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N. Asli, M. I. Vexler, A. F. Shulekin, P. Douglas Yoder, I. V. Grekhov, Peter Seegebrecht:
Threshold energies in the light emission characteristics of silicon MOS tunnel diodes. Microelectron. Reliab. 41(7): 1071-1076 (2001)

Conference and Workshop Papers

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2004
[c1]
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Klaus von Arnim, Eduardo Borinski, Peter Seegebrecht, Horst Fiedler, Ralf Brederlow, Roland Thewes, Jörg Berthold, Christian Pacha:
Efficiency of body biasing in 90 nm CMOS for low power digital circuits. ESSCIRC 2004: 175-178

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