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Pat N. Grillot

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2012
[j1]
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Tigran Nshanian, Pat N. Grillot, Michael Holub, Satoshi Watanabe, Werner Götz:
Effect of residual stress on the electrical activity of dislocations in GaN light emitting diodes. Microelectron. Reliab. 52(9-10): 2039-2042 (2012)

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