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P. Gassot

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2010 – 2019

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2010
[j2]
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  - journals/mr/CharavelRMGBVDMB10
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  - https://dblp.org/rec/journals/mr/CharavelRMGBVDMB10
R. Charavel, Jaume Roig, S. Mouhoubi, P. Gassot, Filip Bauwens, Piet Vanmeerbeek, B. Desoete, Peter Moens, Eddy De Backer:
Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. Microelectron. Reliab. 50(9-11): 1758-1762 (2010)

2000 – 2009

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2004
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Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot:
Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectron. Reliab. 44(9-11): 1621-1624 (2004)

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