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Hui Peng Ng

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2017
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  - https://dblp.org/rec/journals/mr/ChenANRNQTLM17
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai:
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectron. Reliab. 76-77: 261-266 (2017)

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