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P. Chris Hammel

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2003
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P. Chris Hammel, Denis V. Pelekhov, Philip E. Wigen, Timothy R. Gosnell, Melissa M. Midzor, Michael L. Roukes:
The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging. Proc. IEEE 91(5): 789-798 (2003)

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