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Edoardo Zanetti
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Conference and Workshop Papers
- 2023
- [c3]Patrick Fiorenza, Francesco Cordiano, Mario Santo Alessandrino, Alfio Russo, Edoardo Zanetti, Mario Saggio, C. Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte:
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs. IRPS 2023: 1-4 - 2021
- [c2]Patrick Fiorenza, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Elisa Vitanza, Edoardo Zanetti, Filippo Giannazzo, Fabrizio Roccaforte:
Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects. IRPS 2021: 1-6 - [c1]Bruna Mazza, Salvatore Patané, Francesco Cordiano, Massimiliano Giliberto, Giovanni Renna, Andrea Severino, Edoardo Zanetti, Massimo Boscaglia, Giovanni Franco:
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC. IRPS 2021: 1-4
Coauthor Index
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