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Norihiko Ui

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Conference and Workshop Papers

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2018
[c1]
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Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini:
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers. BCICTS 2018: 44-47

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