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Dennis J. Ciplickas

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Conference and Workshop Papers

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2019
[c4]
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  - conf/mixdes/StrojwasDC19
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Andrzej J. Strojwas, Kelvin Doong, Dennis J. Ciplickas:
Yield and Reliability Challenges at 7nm and Below. MIXDES 2019: 52-55
2013
[c3]
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  - conf/vts/YamaguchiARNC13
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Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas:
Special session 12B: Panel post-silicon validation & test in huge variance era. VTS 2013: 1
2007
[c2]
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  - conf/isqed/CrouchBC07
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Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas:
Processing High Volume Scan Test Results for Yield Learning. ISQED 2007: 293-298
1996
[c1]
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Dennis J. Ciplickas, Ronald A. Rohrer:
Expected current distributions for CMOS circuits. ICCAD 1996: 589-592

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