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M. Houssa
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Journal Articles
- 2007
- [j3]A. Shickova, Ben Kaczer, Anabela Veloso, Marc Aoulaiche, M. Houssa, Herman E. Maes, Guido Groeseneken, J. A. Kittl:
NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase. Microelectron. Reliab. 47(4-5): 505-507 (2007) - [j2]M. Houssa, Marc Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns:
Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectron. Reliab. 47(6): 880-889 (2007) - 2005
- [j1]M. Houssa:
Modelling negative bias temperature instabilities in advanced p-MOSFETs. Microelectron. Reliab. 45(1): 3-12 (2005)
Conference and Workshop Papers
- 2015
- [c1]Attilio Belmonte, Andrea Fantini, Augusto Redolfi, M. Houssa, Malgorzata Jurczak, Ludovic Goux:
Optimization of the write algorithm at low-current (10μA) in Cu/Al2O3-based conductive-bridge RAM. ESSDERC 2015: 114-117
Coauthor Index
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