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William Shiue

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2020
[j1]
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Huai-Wei Lo, William Shiue, James Jiann-Haw Liou, Gwo-Hshiung Tzeng:
A hybrid MCDM-based FMEA model for identification of critical failure modes in manufacturing. Soft Comput. 24(20): 15733-15745 (2020)

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