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Cheikh A. Tine

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2020 – today

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2020
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Roshan L. Kini, Shankar Dhakal, Sadab Mahmud, Andrew J. Sellers, Michael R. Hontz, Cheikh A. Tine, Raghav Khanna:
An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. IEEE Access 8: 137312-137321 (2020)

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