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Roza Kotlyar

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Conference and Workshop Papers

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2020
[c1]
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Yao-Feng Chang, James A. O'Donnell, Tony Acosta, Roza Kotlyar, Albert B. Chen, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jeff Hicks:
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. IRPS 2020: 1-4

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