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F. Joffre

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2002
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F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, Coumar Oudéa, J. Fesquet, Jean Gasiot:
Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectron. Reliab. 42(3): 459-461 (2002)

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